Applying the Different Statistical Tests in Analysis of Electrical Breakdown Mechanisms in Nitrogen Filled Gas Diode

This paper presents the results of our investigations of breakdown mechanisms, as well as a description of their influence on the distributions of time delay distributions, for a gas tube filled with nitrogen at 4 mbar. The values of the time delay are measured for different voltages, and the values of the relaxation times and their distributions and probability plots are analyzed. The obtained density distributions have Gaussian distributions and exponential distributions for different values of relaxation times (Gaussian for small values and exponential for large values of relaxation time). It is shown that for middle values of relaxation time the delay distributions have a shape between Gaussian and exponential distributions, which is a result of the different influences of electrical breakdown.