K-shell excitation dielectronic recombination resonance strengths of highly charged He-like to O-like Xe ions

Dielectronic recombination is an important process in high temperature plasmas. In the present work, the KLn (n = L, M, N and O) DR resonance strengths of He-like to O-like xenon ions are measured at the Shanghai electron beam ion trap using a fast electron beam energy scanning method. The experiment uncertainty reaches about 6% with significant improvement of statistics. A relativistic configuration interaction calculation is also made. Theoretical results agree with the experiment results within 15% in most cases.