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Plasma Sci. Technol. ›› 2018, Vol. 20 ›› Issue (5): 054008.

• THE 8TH INTERNATIONAL CONFERENCE ON APPLIED ELECTROSTATICS •

### Measurement of surface charges on the dielectric film based on field mills under the HVDC corona wire

Donglai WANG (王东来) , Tiebing LU (卢铁兵), Yuan WANG (王源), Bo CHEN (陈博) and Xuebao LI (李学宝)1

1. State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electric Power University, Beijing 102206, People’s Republic of China
• Received:2017-10-31 Published:2018-01-29
• Supported by:

This work is supported by the National Key Research and Development Program (Grant No. 2016YFB0900900) and National Natural Science Foundation of China (Grant No. 51577064).

Abstract:

The ion flow field on the ground is one of the significant parameters used to evaluate the electromagnetic environment of high voltage direct current (HVDC) power lines. HVDC lines may cross the greenhouses due to the restricted transmission corridors. Under the condition of ion flow field, the dielectric films on the greenhouses will be charged, and the electric fields in the greenhouses may exceed the limit value. Field mills are widely used to measure the ground-level direct current electric fields under the HVDC power lines. In this paper, the charge inversion method is applied to calculate the surface charges on the dielectric film according to the measured ground-level electric fields. The advantages of hiding the field mill probes in the ground are studied. The charge inversion algorithm is optimized in order to decrease the impact of measurement errors. Based on the experimental results, the surface charge distribution on a piece of quadrate dielectric film under a HVDC corona wire is studied. The enhanced effect of dielectric film on ground-level electric field is obviously weakened with the increase of film height. Compared with the total electric field strengths, the normal components of film-free electric fields at the corresponding film-placed positions have a higher effect on surface charge accumulation.