Plasma Sci. Technol.
Citation Search Quick Search
Plasma Sci. Technol.  2018, Vol. 20 Issue (12): 124001     DOI: 10.1088/2058-6272/aad177
The 4th Workshop on Plasma Diagnostics Current Issue| Archive| Adv Search |
Measurement of impurity lines with two- crystal x-ray spectrometers on EAST
Xinshuai YANG (杨新帅)1, Ruiji HU (胡睿佶)2, Jun CHEN (陈俊)2 , Fudi WANG (王福地)1, Jia FU (符佳)1, Yingying LI (李颖颖)1, Hongming ZHANG (张洪明)1, Yongcai SHEN (沈永才)3, Xianghui YIN (尹相辉)4, Bo LYU (吕波)1 and EAST team1
1 Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031, People’s Republic of China
2 Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, People’s Republic of China
3 School of Physics and Electrical Engineering, Anqing Normal University, Anqing 246011, People’s Republic of China
4 School of Electrical Engineering, University of South China, Hengyang 421001, People’s Republic of China

Copyright © Plasma Sci. Technol.
Address: Institute of Plasma Physics, Chinese Academy of Sciences, P. O. Box 1126, Hefei 230031, China
Tel: +86-551-65591617  65593176   Fax: +86-551-65591310  E-mail: pst@ipp.ac.cn