Haoming XIANG, Andreas KRÄMER-FLECKEN, Xiang HAN, Jia HUANG, Matthias HIRSCH, Gavin WEIR, Dirk HARTMANN, Peter KALLMEYER, Jozef ONGNER, Guntram CZYMEK, Matthias STERN, Timo SCHRÖDER, Andreas DINKLAGE, Alexander KNIEPS, Olaf NEUBAUER, Kristel CROMBÉ, Norbert SANDRI, Vecsei MIKLÓS, Sandor ZOLETNIK, Gábor ANDA, Daniel DUNAI, Dávid NAGY, Dániel Imre RÉFY, Matthias OTTE, David Antonio CASTAŇO BARDAWIL, Rainer SCHICK, Dirk NICOLAI, Marc BEURSKENS, Shuai XU, Jie HUANG, Jianqing CAI, Tao ZHANG, Xiaodong LIN, Xiang GAO, Yunfeng LIANG, W7-X Team. Frequency modulated continuous wave reflectometry for density profile measurement in front of ICRH antenna in Wendelstein 7-XJ. Plasma Science and Technology. DOI: 10.1088/2058-6272/ae3d03
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Citation:
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Haoming XIANG, Andreas KRÄMER-FLECKEN, Xiang HAN, Jia HUANG, Matthias HIRSCH, Gavin WEIR, Dirk HARTMANN, Peter KALLMEYER, Jozef ONGNER, Guntram CZYMEK, Matthias STERN, Timo SCHRÖDER, Andreas DINKLAGE, Alexander KNIEPS, Olaf NEUBAUER, Kristel CROMBÉ, Norbert SANDRI, Vecsei MIKLÓS, Sandor ZOLETNIK, Gábor ANDA, Daniel DUNAI, Dávid NAGY, Dániel Imre RÉFY, Matthias OTTE, David Antonio CASTAŇO BARDAWIL, Rainer SCHICK, Dirk NICOLAI, Marc BEURSKENS, Shuai XU, Jie HUANG, Jianqing CAI, Tao ZHANG, Xiaodong LIN, Xiang GAO, Yunfeng LIANG, W7-X Team. Frequency modulated continuous wave reflectometry for density profile measurement in front of ICRH antenna in Wendelstein 7-XJ. Plasma Science and Technology. DOI: 10.1088/2058-6272/ae3d03
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Haoming XIANG, Andreas KRÄMER-FLECKEN, Xiang HAN, Jia HUANG, Matthias HIRSCH, Gavin WEIR, Dirk HARTMANN, Peter KALLMEYER, Jozef ONGNER, Guntram CZYMEK, Matthias STERN, Timo SCHRÖDER, Andreas DINKLAGE, Alexander KNIEPS, Olaf NEUBAUER, Kristel CROMBÉ, Norbert SANDRI, Vecsei MIKLÓS, Sandor ZOLETNIK, Gábor ANDA, Daniel DUNAI, Dávid NAGY, Dániel Imre RÉFY, Matthias OTTE, David Antonio CASTAŇO BARDAWIL, Rainer SCHICK, Dirk NICOLAI, Marc BEURSKENS, Shuai XU, Jie HUANG, Jianqing CAI, Tao ZHANG, Xiaodong LIN, Xiang GAO, Yunfeng LIANG, W7-X Team. Frequency modulated continuous wave reflectometry for density profile measurement in front of ICRH antenna in Wendelstein 7-XJ. Plasma Science and Technology. DOI: 10.1088/2058-6272/ae3d03
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Citation:
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Haoming XIANG, Andreas KRÄMER-FLECKEN, Xiang HAN, Jia HUANG, Matthias HIRSCH, Gavin WEIR, Dirk HARTMANN, Peter KALLMEYER, Jozef ONGNER, Guntram CZYMEK, Matthias STERN, Timo SCHRÖDER, Andreas DINKLAGE, Alexander KNIEPS, Olaf NEUBAUER, Kristel CROMBÉ, Norbert SANDRI, Vecsei MIKLÓS, Sandor ZOLETNIK, Gábor ANDA, Daniel DUNAI, Dávid NAGY, Dániel Imre RÉFY, Matthias OTTE, David Antonio CASTAŇO BARDAWIL, Rainer SCHICK, Dirk NICOLAI, Marc BEURSKENS, Shuai XU, Jie HUANG, Jianqing CAI, Tao ZHANG, Xiaodong LIN, Xiang GAO, Yunfeng LIANG, W7-X Team. Frequency modulated continuous wave reflectometry for density profile measurement in front of ICRH antenna in Wendelstein 7-XJ. Plasma Science and Technology. DOI: 10.1088/2058-6272/ae3d03
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