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ZHONG Jianying (钟建英), GUO Yujing (郭煜敬), ZHANG Hao (张豪). Pressure and Arc Voltage Measurement in a 252 kV SF6 Puffer Circuit Breaker[J]. Plasma Science and Technology, 2016, 18(5): 490-493. DOI: 10.1088/1009-0630/18/5/08
Citation: ZHONG Jianying (钟建英), GUO Yujing (郭煜敬), ZHANG Hao (张豪). Pressure and Arc Voltage Measurement in a 252 kV SF6 Puffer Circuit Breaker[J]. Plasma Science and Technology, 2016, 18(5): 490-493. DOI: 10.1088/1009-0630/18/5/08

Pressure and Arc Voltage Measurement in a 252 kV SF6 Puffer Circuit Breaker

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  • Received Date: September 07, 2015
  • The pressure distribution in an arcing chamber is critically important for the SF6 puffer circuit breaker design. In this paper, the pressure variation of four locations in the nozzle was measured by piezoresistive and fiber optical pressure sensors at two current levels of 10 kA and 50 kA. An arc voltage measurement was also taken. The results demonstrate that using either type of sensor with a connecting tube is able to detect the fast pressure variation in circuit breakers, however the possible distortion and delay to the pressure transient caused by the tube need further study.
  • 1 Knobloch H, Habedank U. 1999, Arc resistance at current zero: a tool to describe the breaking capacity of SF 6 circuit-breakers at shot-line faults. Eleventh International Symposium on High Voltage Engineering,23-27 Aug. 1999, London, P. 205 2 Knobloch H, Habedank U. 2001, IEE Proceedings-Sci.Meas. Technol., 148: 273 3 Blez B, Guilloux C. 1989, IEEE Power Engineering Review, 621: 64 4 Schavemaker P H, van ber Sluis L, Pharmatrisanti A.2002, IEE Proceedings-Sci. Meas. Technol., 149: 17 5 Noeske H O. 1977, IEEE Trans. PAS, PAS-96: 896 6 van ber Sluis L, Rutgers W R. 1994, IEEE Trans.Power Delivery, 10: 137 7 Isaac L T, Jones G R, Humphries J E, et al. 1999, IEE Proceedings-Sci. Meas. Technol., 146: 199 8 Wang W Z, Yan J D, Rong M Z, et al. 2013, IEEE Transactions on Plasma Science, 41: 915 9 Wu Y, Wang W Z, Rong M Z, et al. 2014, IEEE Transaction on Dielectrics and Electrical Insulation, 20: 129 10 Taylor S, Fang M T C, Jones G R, et al. 1991, IEE Proceedings A, 138: 259 11 Isaac L T, Spencer J W, Humphries J, et al. 1999, IEE Proceedings-Gener. Transm. Distrib., 146: 453 12 Pei Y Q, Zhong J Y, Zhang J M, et al. 2014, Journal and Physics D: Applied Physics, 47: 335201 13 Leclerc J L, Smith M R, Jones G R. 1980, IEEE Transitions on Plasma Science, PS-8: 376 14 Lin X, Di Q, Han S M. 2008, Proceedings of the CSEE,15: 130 (in Chinese)
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