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Peifang YANG (杨培芳), Chao YE (叶超), Xiangying WANG (王响英), Jiamin GUO (郭佳敏), Su ZHANG (张苏). Control of growth and structure of Ag films by the driving frequency of magnetron sputtering[J]. Plasma Science and Technology, 2017, 19(8): 85504-085504. DOI: 10.1088/2058-6272/aa6619
Citation: Peifang YANG (杨培芳), Chao YE (叶超), Xiangying WANG (王响英), Jiamin GUO (郭佳敏), Su ZHANG (张苏). Control of growth and structure of Ag films by the driving frequency of magnetron sputtering[J]. Plasma Science and Technology, 2017, 19(8): 85504-085504. DOI: 10.1088/2058-6272/aa6619

Control of growth and structure of Ag films by the driving frequency of magnetron sputtering

  • The growth and structural properties of Ag films prepared by radio-frequency (2, 13.56 and 27.12 MHz) and very-high-frequency (40.68 and 60 MHz) magnetron sputtering were investigated. Using 2 MHz sputtering, the Ag film has a high deposition rate, a uniform and smooth surface and a good fcc structure. Using 13.56 and 27.12 MHz sputtering, the Ag films still have a high deposition rate and a good fcc structure, but a non-uniform and coarse surface. Using 40.68 MHz sputtering, the Ag film has a moderate deposition rate and a good fcc structure, but a less smooth surface. Using 60 MHz sputtering, the Ag film has a uniform and smooth surface, but a low deposition rate and a poor fcc structure. The growth and structural properties of Ag films are related to the ions’ energy and flux density. Therefore, changing the driving frequency is a good way to control the growth and structure of the Ag films.
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