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Tijian DENG (邓体建), Tao LAN (兰涛), Mingsheng TAN (谭名昇), Junfeng ZHU (朱军锋), Jie WU (吴捷), Hangqi XU (许航齐), Chen CHEN (陈晨), Yolbarsop ADIL (阿迪里), Sen ZHANG (张森), Jiaren WU (邬佳仁), Yiming ZU (祖一鸣), Wenzhe MAO (毛文哲), Hong LI (李弘), Jinlin XIE (谢锦林), Ahdi LIU (刘阿娣), Zixi LIU (刘子奚), Zhengwei WU (吴征威), Hai WANG (汪海), Xiaohui WEN (温晓辉), Haiyang ZHOU (周海洋), Zian WEI (卫子安), Chijin XIAO (肖持进), Weixing DING (丁卫星), Ge ZHUANG (庄革), Wandong LIU (刘万东). Fast radial scanning probe system on KTX[J]. Plasma Science and Technology, 2020, 22(4): 45602-045602. DOI: 10.1088/2058-6272/ab5b1a
Citation: Tijian DENG (邓体建), Tao LAN (兰涛), Mingsheng TAN (谭名昇), Junfeng ZHU (朱军锋), Jie WU (吴捷), Hangqi XU (许航齐), Chen CHEN (陈晨), Yolbarsop ADIL (阿迪里), Sen ZHANG (张森), Jiaren WU (邬佳仁), Yiming ZU (祖一鸣), Wenzhe MAO (毛文哲), Hong LI (李弘), Jinlin XIE (谢锦林), Ahdi LIU (刘阿娣), Zixi LIU (刘子奚), Zhengwei WU (吴征威), Hai WANG (汪海), Xiaohui WEN (温晓辉), Haiyang ZHOU (周海洋), Zian WEI (卫子安), Chijin XIAO (肖持进), Weixing DING (丁卫星), Ge ZHUANG (庄革), Wandong LIU (刘万东). Fast radial scanning probe system on KTX[J]. Plasma Science and Technology, 2020, 22(4): 45602-045602. DOI: 10.1088/2058-6272/ab5b1a
  • A fast radial scanning probe system was constructed for the Keda Torus eXperiment (KTX) to measure the profiles of boundary plasma parameters such as floating potential, electron density, temperature, transport fluxes, etc. The scanning probe system is driven by slow and fast motion mechanisms, corresponding to the stand-by movement of a stepping motor and the fast scanning movement of a high-torque servo-motor, respectively. In fast scanning, the scanner drives the probe radially up to 20 cm at a maximum velocity of 4.0 m s−1. A noncontact magnetic grating ruler with a high spatial resolution of 5 μm is used for the displacement measurement. New scanning probe can reach the center of plasmas rapidly. The comparison of plasma floating potential profiles obtained by a fixed radial rake probe and the single scanning probe suggests that the high-speed scanning probe system is reliable for measuring edge plasma parameter profiles on the KTX device.
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