O L KRUTKIN, A B ALTUKHOV, A D GURCHENKO, E Z GUSAKOV, S HEURAUX, M A IRZAK, L A ESIPOV, T P KIVINIEMI, C LECHTE, S LEERINK, P NISKALA, G ZADVITSKIY. Investigation of nonlinear effects in Doppler reflectometry using full-wave synthetic diagnostics[J]. Plasma Science and Technology, 2020, 22(6): 64001-064001. DOI: 10.1088/2058-6272/ab5c28
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O L KRUTKIN, A B ALTUKHOV, A D GURCHENKO, E Z GUSAKOV, S HEURAUX, M A IRZAK, L A ESIPOV, T P KIVINIEMI, C LECHTE, S LEERINK, P NISKALA, G ZADVITSKIY. Investigation of nonlinear effects in Doppler reflectometry using full-wave synthetic diagnostics[J]. Plasma Science and Technology, 2020, 22(6): 64001-064001. DOI: 10.1088/2058-6272/ab5c28
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O L KRUTKIN, A B ALTUKHOV, A D GURCHENKO, E Z GUSAKOV, S HEURAUX, M A IRZAK, L A ESIPOV, T P KIVINIEMI, C LECHTE, S LEERINK, P NISKALA, G ZADVITSKIY. Investigation of nonlinear effects in Doppler reflectometry using full-wave synthetic diagnostics[J]. Plasma Science and Technology, 2020, 22(6): 64001-064001. DOI: 10.1088/2058-6272/ab5c28
Citation:
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O L KRUTKIN, A B ALTUKHOV, A D GURCHENKO, E Z GUSAKOV, S HEURAUX, M A IRZAK, L A ESIPOV, T P KIVINIEMI, C LECHTE, S LEERINK, P NISKALA, G ZADVITSKIY. Investigation of nonlinear effects in Doppler reflectometry using full-wave synthetic diagnostics[J]. Plasma Science and Technology, 2020, 22(6): 64001-064001. DOI: 10.1088/2058-6272/ab5c28
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