Advanced Search+
Min YANG, Kaixuan QI, Jiuwen YANG, Sa JIA, Haoyan LIU, Yanyang CHEN, Jin LI, Xiaoping LI. The multi-peak point phenomenon of broadband microwave reflection caused by inhomogeneous plasma[J]. Plasma Science and Technology, 2024, 26(7): 075001. DOI: 10.1088/2058-6272/ad34ba
Citation: Min YANG, Kaixuan QI, Jiuwen YANG, Sa JIA, Haoyan LIU, Yanyang CHEN, Jin LI, Xiaoping LI. The multi-peak point phenomenon of broadband microwave reflection caused by inhomogeneous plasma[J]. Plasma Science and Technology, 2024, 26(7): 075001. DOI: 10.1088/2058-6272/ad34ba

The multi-peak point phenomenon of broadband microwave reflection caused by inhomogeneous plasma

  • During spacecraft re-entry, the challenge of measuring plasma sheath parameters directly contributes to difficulties in addressing communication blackout. In this work, we have discovered a phenomenon of multiple peaks in reflection data caused by the inhomogeneous plasma. Simulation results show that the multi-peak points fade away as the characteristic frequency is approached, resembling a series of gradually decreasing peaks. The positions and quantities of these points are positively correlated with electron density, yet they show no relation to collision frequency. This phenomenon is of significant reference value for future studies on the spatial distribution of plasmas, particularly for using microwave reflection signals in diagnosing the plasma sheath.
  • loading

Catalog

    Turn off MathJax
    Article Contents

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return