Analysis and prediction of sputtering yield using combined hierarchical clustering analysis and artificial neural network algorithms

Yu CHEN; Jiawei LUO; Wen LEI; Yan SHEN; Shuai CAO

doi:10.1088/2058-6272/ad709c

Yu CHEN, Jiawei LUO, Wen LEI, Yan SHEN, Shuai CAO. Analysis and prediction of sputtering yield using combined hierarchical clustering analysis and artificial neural network algorithms[J]. Plasma Science and Technology. DOI: 10.1088/2058-6272/ad709c

Citation:

Yu CHEN, Jiawei LUO, Wen LEI, Yan SHEN, Shuai CAO. Analysis and prediction of sputtering yield using combined hierarchical clustering analysis and artificial neural network algorithms[J]. Plasma Science and Technology. DOI: 10.1088/2058-6272/ad709c

Citation:

Yu CHEN, Jiawei LUO, Wen LEI, Yan SHEN, Shuai CAO. Analysis and prediction of sputtering yield using combined hierarchical clustering analysis and artificial neural network algorithms[J]. Plasma Science and Technology. DOI: 10.1088/2058-6272/ad709c

Analysis and prediction of sputtering yield using combined hierarchical clustering analysis and artificial neural network algorithms

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Analysis and prediction of sputtering yield using combined hierarchical clustering analysis and artificial neural network algorithms

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