Haoming Xiang, Andreas Krämer-Flecken, Xiang Han, Jia Huang, Matthias Hirsch, Gavin Weir, Dirk Hartmann, Peter Kallmeyer, Jozef Ongena, Guntram Czymek, Mathias Stern, Timo Schroeder, Andreas Dinklage, Alexander Knieps, Olaf Neubauer, Kristel Crombe, Norbert Sandri, Vecsei Miklos, Sandor Zoletnik, Gabor Anda, Daniel Dunai, David Nagy, Daniel Refy, Matthias Otte, David Bardawil, Rainer Schick, Dirk Nicolai, Marcus Beurskens, Shuai Xu, Jie Huang, Jianqing Cai, Tao Zhang, Xiaodong Lin, Xiang Gao, Yunfeng Liang. Frequency modulated continuous wave reflectometry for density profile measurement in front of ICRH antenna in Wendelstein 7-XJ. Plasma Science and Technology.
|
Citation:
|
Haoming Xiang, Andreas Krämer-Flecken, Xiang Han, Jia Huang, Matthias Hirsch, Gavin Weir, Dirk Hartmann, Peter Kallmeyer, Jozef Ongena, Guntram Czymek, Mathias Stern, Timo Schroeder, Andreas Dinklage, Alexander Knieps, Olaf Neubauer, Kristel Crombe, Norbert Sandri, Vecsei Miklos, Sandor Zoletnik, Gabor Anda, Daniel Dunai, David Nagy, Daniel Refy, Matthias Otte, David Bardawil, Rainer Schick, Dirk Nicolai, Marcus Beurskens, Shuai Xu, Jie Huang, Jianqing Cai, Tao Zhang, Xiaodong Lin, Xiang Gao, Yunfeng Liang. Frequency modulated continuous wave reflectometry for density profile measurement in front of ICRH antenna in Wendelstein 7-XJ. Plasma Science and Technology.
|
Haoming Xiang, Andreas Krämer-Flecken, Xiang Han, Jia Huang, Matthias Hirsch, Gavin Weir, Dirk Hartmann, Peter Kallmeyer, Jozef Ongena, Guntram Czymek, Mathias Stern, Timo Schroeder, Andreas Dinklage, Alexander Knieps, Olaf Neubauer, Kristel Crombe, Norbert Sandri, Vecsei Miklos, Sandor Zoletnik, Gabor Anda, Daniel Dunai, David Nagy, Daniel Refy, Matthias Otte, David Bardawil, Rainer Schick, Dirk Nicolai, Marcus Beurskens, Shuai Xu, Jie Huang, Jianqing Cai, Tao Zhang, Xiaodong Lin, Xiang Gao, Yunfeng Liang. Frequency modulated continuous wave reflectometry for density profile measurement in front of ICRH antenna in Wendelstein 7-XJ. Plasma Science and Technology.
|
Citation:
|
Haoming Xiang, Andreas Krämer-Flecken, Xiang Han, Jia Huang, Matthias Hirsch, Gavin Weir, Dirk Hartmann, Peter Kallmeyer, Jozef Ongena, Guntram Czymek, Mathias Stern, Timo Schroeder, Andreas Dinklage, Alexander Knieps, Olaf Neubauer, Kristel Crombe, Norbert Sandri, Vecsei Miklos, Sandor Zoletnik, Gabor Anda, Daniel Dunai, David Nagy, Daniel Refy, Matthias Otte, David Bardawil, Rainer Schick, Dirk Nicolai, Marcus Beurskens, Shuai Xu, Jie Huang, Jianqing Cai, Tao Zhang, Xiaodong Lin, Xiang Gao, Yunfeng Liang. Frequency modulated continuous wave reflectometry for density profile measurement in front of ICRH antenna in Wendelstein 7-XJ. Plasma Science and Technology.
|