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Chen Zhou, Alisa Gorqid, Zhongbo Sun, Aleksandr Astafiev, Anatoly Kudryavtsev, Jingfeng Yao, Dewei Gong, Zhongxiang Zhou, Chengxun Yuan. Plasma electron spectroscopy for chemical analysis[J]. Plasma Science and Technology.
Citation: Chen Zhou, Alisa Gorqid, Zhongbo Sun, Aleksandr Astafiev, Anatoly Kudryavtsev, Jingfeng Yao, Dewei Gong, Zhongxiang Zhou, Chengxun Yuan. Plasma electron spectroscopy for chemical analysis[J]. Plasma Science and Technology.

Plasma electron spectroscopy for chemical analysis

  • This study presents a detailed analysis and refinement of a novel plasma electron spectroscopy technique. The proposed method is designed for integration with gas chromatography systems to facilitate chemical composition analysis of substances. Unlike classical collisionless electron spectroscopy, plasma electron spectroscopy functions without the need for high vacuum conditions and remains effective even when electrons undergo multiple elastic collisions. The core principle of this technique involves the detection of Penning electrons within an ionized gas mixture, composed of a base gas and analytical impurities. This detection necessitates the application of established plasma diagnostic techniques, such as probe measurements. A key outcome of this approach is its applicability at elevated pressures, extending up to several hundred Torr. The method’s efficacy has been validated across an extensive range of chemical compounds, from simple inert gases to complex, multicomponent organic mixtures. Furthermore, the feasibility of analyzing both gaseous mixtures and solid samples is demonstrated. Although detailed examination revealed that the resulting curves do not always correspond to conventional electron spectra, the obtained dependences provide a reliable means of detecting Penning electrons. Analysis of these electrons enables the detection and characterization of the studied impurities. Overall, this method offers significant potential for high-pressure impurity detection and identification in gaseous systems.
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