Experimental Determination of the ICRF Power Depositing on the Electrons in HT-7

This paper reports for the first time an experimental study on the power deposition profile of the ion cyclotron range frequencies (ICRF) power depositing on electrons in HT-7. The fast Fourier transform (FFT) analysis and the break in slope (BIS) method are utilized to obtain the information of the power deposition. The results indicate that the electrons were heated directly, and the electrons absorbed around 20% of the input power of the discharge of interest.