LIU Cong (刘聪), WANG Jianhua (汪建华), LIU Sijia(刘斯佳), et al.. Effects of Surface Pretreatment on Nucleation and Growth of Ultra-Nanocrystalline Diamond Films[J]. Plasma Science and Technology, 2015, 17(6): 496-501. DOI: 10.1088/1009-0630/17/6/10
Citation:
LIU Cong (刘聪), WANG Jianhua (汪建华), LIU Sijia(刘斯佳), et al.. Effects of Surface Pretreatment on Nucleation and Growth of Ultra-Nanocrystalline Diamond Films[J]. Plasma Science and Technology, 2015, 17(6): 496-501. DOI: 10.1088/1009-0630/17/6/10
LIU Cong (刘聪), WANG Jianhua (汪建华), LIU Sijia(刘斯佳), et al.. Effects of Surface Pretreatment on Nucleation and Growth of Ultra-Nanocrystalline Diamond Films[J]. Plasma Science and Technology, 2015, 17(6): 496-501. DOI: 10.1088/1009-0630/17/6/10
Citation:
LIU Cong (刘聪), WANG Jianhua (汪建华), LIU Sijia(刘斯佳), et al.. Effects of Surface Pretreatment on Nucleation and Growth of Ultra-Nanocrystalline Diamond Films[J]. Plasma Science and Technology, 2015, 17(6): 496-501. DOI: 10.1088/1009-0630/17/6/10
1Key Laboratory of Plasma Chemistry and Advanced Materials of Hubei Province, Wuhan Institute of Technology, Wuhan 430073, China 2Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 23003, China 3Zhongnan University of Economics and Law, Wuhan 430073, China
Funds: supported by the Natural Science Foundation of China (No. 11175137) and the Research Fund of Wuhan Institute of Technology (No. 11111051)
The effects of different surface pretreatment methods on the nucleation and growth of ultra-nanocrystalline diamond (UNCD) films grown from focused microwave Ar/CH4/H2 (argon-rich) plasma were systematically studied. The surface roughness, nucleation density, microstructure, and crystallinity of the obtained UNCD films were characterized by atomic force microscope (AFM), scanning electron microscopy (SEM), X-ray diffraction (XRD), and Raman spectroscopy. The results indicate that the nucleation enhancement was found to be sensitive to the different surface pretreatment methods, and a higher initial nucleation density leads to highly smooth UNCD films. When the silicon substrate was pretreated by a two-step method, i.e., plasma treatment followed by ultrasonic vibration with diamond nanopowder, the grain size of the UNCD films was greatly decreased: about 7.5 nm can be achieved. In addition, the grain size of UNCD films depends on the substrate pretreatment methods and roughness, which indicates that the surface of substrate profile has a "genetic characteristic".