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LU Dong, LI Wenjian, WU Xin, WANG Jufang, MA Shuang, LIU Qingfang, HE Jinyu, JING Xigang, DING Nan. Study on DNA Damage Induced by Neon Beam Irradiation in Saccharomyces Cerevisiae[J]. Plasma Science and Technology, 2010, 12(6): 753-756.
Citation: LU Dong, LI Wenjian, WU Xin, WANG Jufang, MA Shuang, LIU Qingfang, HE Jinyu, JING Xigang, DING Nan. Study on DNA Damage Induced by Neon Beam Irradiation in Saccharomyces Cerevisiae[J]. Plasma Science and Technology, 2010, 12(6): 753-756.

Study on DNA Damage Induced by Neon Beam Irradiation in Saccharomyces Cerevisiae

Funds: supported by Natural Science Foundation of Gansu Province, No. 096RJZA126, Department of Science And Technology, Gansu Province, China.
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  • Corresponding author:

    LU Dong, Tel.: +86 0931 4969342; fax: +86 0931 4969201. E-mail address: ld@impcas.ac.cn

    LI Wenjian, wjli@impcas.ac.cn, Tel.: +86 0931 4969175; fax: +86 0931 4969201

  • Yeast strain Saccharomyces cerevisiae was irradiated with different doses of 85 MeV/u 20Ne10+ to investigate DNA damage induced by heavy ion beam in eukaryotic microorganism. The survival rate, DNA double strand breaks (DSBs) and DNA polymorphic were tested after irradiation. The results showed that there were substantial differences in DNA between the control and irradiated samples. At the dose of 40 Gy, the yeast cell survival rate approached 50%, DNA double-strand breaks were barely detectable, and significant DNA polymorphism was observed. The alcohol dehydrogenase II gene was amplified and sequenced. It was observed that base changes in the mutant were mainly transversions of T→G and T→C. It can be concluded that heavy ion beam irradiation can lead to change in single gene and may be an effective way to induce mutation.
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