Numerical simulation of constricted and diffusive arc–anode attachments in wallstabilized transferred argon arcs

Tao ZHU (朱涛); Haixing WANG (王海兴); Surong SUN (孙素蓉); Jinyue GENG (耿金越); Yan SHEN (沈岩)

doi:10.1088/2058-6272/ab4722

Plasma Science and Technology > 2019 > 21(12): 125406. > DOI: 10.1088/2058-6272/ab4722

Tao ZHU (朱涛), Haixing WANG (王海兴), Surong SUN (孙素蓉), Jinyue GENG (耿金越), Yan SHEN (沈岩). Numerical simulation of constricted and diffusive arc–anode attachments in wallstabilized transferred argon arcs[J]. Plasma Science and Technology, 2019, 21(12): 125406. DOI: 10.1088/2058-6272/ab4722

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Numerical simulation of constricted and diffusive arc–anode attachments in wallstabilized transferred argon arcs

¹ School of Astronautics, Beijing University of Aeronautics and Astronautics, Beijing 100191, People's Republic of China
² Beijing Institute of Control Engineering, Beijing 100080, People's Republic of China

Funds: This work was supported by National Natural Science Foundation of China (Nos. 11735004, 11575019, 11702021) and the National Postdoctoral Program for Innovative Talents (BX20180029).

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Received Date: July 31, 2019
Revised Date: September 22, 2019
Accepted Date: September 23, 2019

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Abstract

Abstract

A numerical simulation is conducted to investigate arc–anode attachment behavior, especially the formation mechanism of the constricted arc attachment mode for the water-cooled anode of wall-stabilized transferred argon arcs. Argon molecular ions and the corresponding kinetic processes are included to the finite-rate chemistry model in order to capture the chemical nonequilibrium characteristics of the arc near the anode region. Modeling results show that constricted and diffusive arc–anode attachments can be self-consistently obtained at different arc currents while keeping other parameters unchanged. The dominant kinetic processes contributing to ionization and recombination in the arc center and fringes are presented. The results show that in arc fringes and the arc attachment region, molecular ion recombination plays an important role which leads to the rapid loss of electrons. The radial evolution of the production, loss and transport processes of electrons is further analyzed. It is found that for the constricted arc attachment mode, both the recombination and convection transport caused by the anode jet result in the loss of electrons at the arc fringes, which leads to the shrinkage of the arc column at the anode. The formation of the anode jet is due to the combined action of radial and axial Lorentz forces in the anode region.
- DC transferred arc,
- arc attachment mode,
- chemical nonequilibrium

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References

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Numerical simulation of constricted and diffusive arc–anode attachments in wallstabilized transferred argon arcs