Fullwave Doppler reflectometry simulations for density turbulence spectra in ASDEX Upgrade using GENE and IPF-FD3D

C LECHTE; G D CONWAY; TGÖRLER; T HAPPEL; the ASDEXUpgrade Team

doi:10.1088/2058-6272/ab7ce8

Plasma Science and Technology > 2020 > 22(6): 64006-064006. > DOI: 10.1088/2058-6272/ab7ce8

C LECHTE, G D CONWAY, TGÖRLER, T HAPPEL, the ASDEXUpgrade Team. Fullwave Doppler reflectometry simulations for density turbulence spectra in ASDEX Upgrade using GENE and IPF-FD3D[J]. Plasma Science and Technology, 2020, 22(6): 64006-064006. DOI: 10.1088/2058-6272/ab7ce8

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Fullwave Doppler reflectometry simulations for density turbulence spectra in ASDEX Upgrade using GENE and IPF-FD3D

¹ Institute of Interfacial Process Engineering and Plasma Technology IGVP, Universität Stuttgart, D-70569 Stuttgart, Germany
² Max-Planck-Institute for Plasma Physics, D-85748 Garching, Germany

Funds: This work has been carried out within the framework of the EUROfusion Consortium and has received funding from the Euratom research and training program 2014–2018 and 2019–2020 under grant agreement No. 633053.

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Received Date: October 30, 2019
Revised Date: March 03, 2020
Accepted Date: March 04, 2020

Graphical Abstract

Abstract

Abstract

Doppler reflectometry is an important microwave diagnostic for turbulent fusion plasmas. A microwave beam is scattered off density fluctuations, with wavenumbers according to incident frequency and relative direction. This way, a density fluctuation spectrum is measured. However, the correspondence between fluctuation power and scattered microwave power is strongly nonlinear. Studying these processes numerically therefore requires fullwave simulations (IPF-FD3D), with density fluctuations supplied by a separate plasma turbulence code (GENE). Earlier such attempts suffered from the low number of data points in the ‘interesting’ part of the spectrum, where a power law had to be fitted to 4 or 5 points. This has been overcome with recent simulations, which now show a much better agreement with experimental data.
- plasma diagnostics,
- Doppler reflectometry,
- simulation,
- microwaves

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References (22)

References

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