Two-dimensional analysis of a negative differential conductance gate transistor as a THz emitter

Sh RAHMATALLAHPUR; A ROSTAMI; S KHORRAM

doi:10.1088/2058-6272/aa4ee2

Plasma Science and Technology > 2017 > 19(4): 45001-045001. > DOI: 10.1088/2058-6272/aa4ee2

Sh RAHMATALLAHPUR, A ROSTAMI, S KHORRAM. Two-dimensional analysis of a negative differential conductance gate transistor as a THz emitter[J]. Plasma Science and Technology, 2017, 19(4): 45001-045001. DOI: 10.1088/2058-6272/aa4ee2

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Two-dimensional analysis of a negative differential conductance gate transistor as a THz emitter

1 Photonics and Nanocrystal Research Lab. (PNRL), Faculty of Electrical and Computer Engineering, University of Tabriz, Tabriz 51666-14761, Iran 2 Photonics Group, Research Institute for Applied Physics and Astronomy (RIAPA), University of Tabriz, Tabriz 51664-14761, Iran

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Received Date: June 07, 2016

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Abstract

Abstract

We investigate plasma modes in a transistor including a negative differential conductance in the gate. The analytical results show that the plasma wave generation is substantially influenced by the lateral direction (width of the transistor), gate leakage current and viscosity. The injection from the gate (opposed to the gate leakage current) can improve the plasma oscillations and their amplitude with respect to ordinary transistors. We also estimate, which to our best knowledge has been derived for the first time, the total power emitted by the transistor and the emitted pattern which qualitatively gives reasonable agreement with the experimental data. The results show that the radiated power depends on various parameters such as drift velocity, momentum relaxation time, gate leakage current and especially the lateral direction. A negative gate current enhances the power while the gate leakage current decreases the power.
- terahertz emitter,
- solid state plasma,
- two-dimensional analysis,
- negative differential conductance

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References (20)

References

[1]	Dyakonov M I and Shur M 1993 Phys. Rev. Lett. 71 2465
[2]	Dyakonov M I 2008 Semiconductors 42 984
[3]	Lusakowski J et al 2005 J. Appl. Phys. 97 064307
[4]	El Fatimy A et al 2010 J. Appl. Phys. 107 024504
[5]	Ryzhii V et al 2006 J. Appl. Phys. 99 084507
[6]	Satou A et al 2008 SISPAD 2008: Int. Conf. on Simulation of Semiconductor Processes and Devices (Hakone: IEEE) p197
[7]	Satou A et al 2009 Phys. Status Solidi b 9 2146
[8]	Ryzhii V and Shur M 2001 Japan. J. Appl. Phys. 40 546
[9]	Deutschmann R et al 2000 Physica E 7 294
[10]	Rodríguez B S et al 2013 IEEE Trans. Terahertz Sci. Technol. 3 200
[11]	Rodríguez B S et al 2012 ECS Trans. 49 93
[12]	Asada M, Suzuki S and Kishimoto N 2008 Japan. J. Appl. Phys. 47 4375
[13]	Suzuki S et al 2010 Appl. Phys. Lett. 97 42102
[14]	Suzuki S et al 2009 Appl. Phys. Express 2 054501
[15]	Zhang L 2016 Plasma Sci. Technol. 18 360
[16]	Landau L D and Lifshitz E M 1978 Fluid Mechanics (Oxford: Pergamon)
[17]	Rupper G, Rudin S and Crowne F J 2012 Solid State Electron. 78 102
[18]	Mendoza M, Herrmann H J and Succi S 2013 Sci. Rep. 3 1052
[19]	Dmitriev A P, Furman A S and Kachorovskii V Y 1996 Phys. Rev. B 54 14020
[20]	Jackson J D 1962 Classical Electrodynamics (Singapore: Wiley)

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