1 Zhu K, Kuryatkov V, Borisov B, et al. 2004, Journal of Applied Physics, 95: 4635 2 Mark Bradley R. 2013, Journal of Applied Physics,114: 224306 3 Langmuir, Mott Smith H. 1924, General Electric Reviews, 27: 449 4 Van Nieuwenhove R, Van Oost G. 1988, Review of Scientific Instruments, 59: 1053 5 Boedo J A, Gray D, Conn R W, et al. 1999, Review of Scientific Instruments, 70: 2997 6 Rudakov D L, Boedo J A, Moyer R A, et al. 2001, Review of Scientific Instruments, 72: 453 7 Lee M H, Jang S H, Chung C W. 2007, Journal of Applied Physics, 101: 033305 8 Pang J H, Lu W Q, Xin Y, et al. 2012, Plasma Science and Technology, 14: 172 9 Hwang K T, Oh S J, Choi I J, et al. 2010, Physics of Plasmas, 17: 063501 10 Bang J Y, Yoo K, Kim D H, et al. 2011, Plasma Sources Science and Technology, 20: 065005 11 Oh S J, Choi I J, Kim J Y, et al. 2012, Measurement Science and Technology, 23: 085001 12 Xu J, Deng X L, Zhang J L, et al. 2001, Thin Solid Films, 390: 107 13 http://www.physics.ucla.edu/plasma-exp/180E-W97/DprobeAnalysis.html 14 Patra S K, Rao G Mohan. 2004, Vacuum, 74: 93 15 Liu F X, Yao K L, Liu Z L. 2007, Applied Surface Science, 253: 6957
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