Trap distribution of polymeric materials and its effect on surface flashover in vacuum

Chengyan REN (任成燕); Chuansheng ZHANG (张传升); Duo HU (胡多); Cheng ZHANG (章程); Fei KONG (孔飞); Tao SHAO (邵涛); Ping YAN (严萍)

doi:10.1088/2058-6272/ab580d

Plasma Science and Technology > 2020 > 22(4): 44002-044002. > DOI: 10.1088/2058-6272/ab580d

Chengyan REN (任成燕), Chuansheng ZHANG (张传升), Duo HU (胡多), Cheng ZHANG (章程), Fei KONG (孔飞), Tao SHAO (邵涛), Ping YAN (严萍). Trap distribution of polymeric materials and its effect on surface flashover in vacuum[J]. Plasma Science and Technology, 2020, 22(4): 44002-044002. DOI: 10.1088/2058-6272/ab580d

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Trap distribution of polymeric materials and its effect on surface flashover in vacuum

¹ Key Laboratory of Power Electronics and Electric Drive, Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing 100190, People's Republic of China
² University of Chinese Academy of Sciences, Beijing 100049, People's Republic of China
³ Northeast Electric Power Design Institute of China Power Engineering Consulting Group Corporation, Changchun 130021, People's Republic of China

Funds: This work is supported by National Natural Science Foundation of China (Nos. 51977202, U1830135, 51807189) and the Scientific Instrument Developing Project of the Chinese Academy of Sciences (No. YJKYYQ20170004).

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Received Date: August 27, 2019
Revised Date: November 13, 2019
Accepted Date: November 13, 2019

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Abstract

Abstract

The surface trap parameter can significantly affect the development of surface flashover in vacuum, but the effective mode and mechanism are not very clear yet. The trap parameters of three polymeric materials were tested and calculated by means of isothermal surface potential decay. The flashover experiment was developed under different applied voltages. The results show a positive correlation between the withstand voltage and the deep trap, i.e., the deeper trap energy level is, the higher flashover voltage is. The dynamics process of charge trapping and detrapping was analyzed based on the charge transport model in dielectrics with a single trap level and two discrete trap levels. The time of charge trapping was compared with that of the discharge development. The results show that the charge trapping time is longer than the flashover development time. The way to influence flashover for a trap is not to decrease the secondary electrons in single discharge development, but to change the electric field distribution on the dielectric surface by charge capture.
- surface flashover,
- trap distribution,
- vacuum,
- trap level,
- polymer

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References (32)

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